JPH0161672U - - Google Patents

Info

Publication number
JPH0161672U
JPH0161672U JP16521187U JP16521187U JPH0161672U JP H0161672 U JPH0161672 U JP H0161672U JP 16521187 U JP16521187 U JP 16521187U JP 16521187 U JP16521187 U JP 16521187U JP H0161672 U JPH0161672 U JP H0161672U
Authority
JP
Japan
Prior art keywords
package
leakage current
semiconductor device
leads
current measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP16521187U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP16521187U priority Critical patent/JPH0161672U/ja
Publication of JPH0161672U publication Critical patent/JPH0161672U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP16521187U 1987-06-01 1987-10-27 Pending JPH0161672U (en])

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16521187U JPH0161672U (en]) 1987-06-01 1987-10-27

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP8585487 1987-06-01
JP16521187U JPH0161672U (en]) 1987-06-01 1987-10-27

Publications (1)

Publication Number Publication Date
JPH0161672U true JPH0161672U (en]) 1989-04-19

Family

ID=31718600

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16521187U Pending JPH0161672U (en]) 1987-06-01 1987-10-27

Country Status (1)

Country Link
JP (1) JPH0161672U (en])

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