JPH0161672U - - Google Patents
Info
- Publication number
- JPH0161672U JPH0161672U JP16521187U JP16521187U JPH0161672U JP H0161672 U JPH0161672 U JP H0161672U JP 16521187 U JP16521187 U JP 16521187U JP 16521187 U JP16521187 U JP 16521187U JP H0161672 U JPH0161672 U JP H0161672U
- Authority
- JP
- Japan
- Prior art keywords
- package
- leakage current
- semiconductor device
- leads
- current measuring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16521187U JPH0161672U (en]) | 1987-06-01 | 1987-10-27 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8585487 | 1987-06-01 | ||
JP16521187U JPH0161672U (en]) | 1987-06-01 | 1987-10-27 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0161672U true JPH0161672U (en]) | 1989-04-19 |
Family
ID=31718600
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP16521187U Pending JPH0161672U (en]) | 1987-06-01 | 1987-10-27 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0161672U (en]) |
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1987
- 1987-10-27 JP JP16521187U patent/JPH0161672U/ja active Pending